Testing for Transistor Aging

  title={Testing for Transistor Aging},
  author={A. Hakan Baba and Subhasish Mitra},
  journal={2009 27th IEEE VLSI Test Symposium},
Transistor aging results in circuit delay degradation over time,and is a growing concern for future systems. On-line circuit failure prediction, together with on-line self-test, can overcome transistor aging challenges for robust systems with built-in self-healing.Effective circuit failure prediction requires very thorough testing to estimate the amount of aging in various parts of a large design during system operation. This paper introduces such testing techniques. Results on large designs… CONTINUE READING
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An efficient method to identify critical gates under circuit aging,

  • W. Wang
  • 2007
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