Testing embedded-core based system chips

@inproceedings{Zorian1998TestingEB,
  title={Testing embedded-core based system chips},
  author={Yervant Zorian and Erik Jan Marinissen and Sujit Dey},
  booktitle={ITC},
  year={1998}
}
Advances in semiconductor process and design technology enable the design of complex system chips. Traditional IC design, in which every circuit is designed from scratch and reuse is limited to standard-cell libraries, is more and more replaced by a design style based on embedding large reusable modules, the so-called cores. This core-based design poses a series of new challenges, especially in the domains of manufacturing test and design validation and debug. This paper provides an overview of… CONTINUE READING
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A Structured Test Re-Use Methodology for Systems on Silicon

Prab Varma, Sandeep Bhatia
In Digest of Papers of IEEE International Workshop on Testing Embedded Core-Based Systems , • 1997
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