Testing and characterization of the one-bit first-order delta-sigma modulator for on-chip analog signal analysis

Abstract

Delta-sigma modulation has become popular in modern analog-to-digital (AD) modulator design due to their relatively high immunity to process variations. In this paper, we propose efficient characterization techniques to obtain the key performance parameters of the 1-bit first-order delta-sigma modulator which is intended to be used as an on-chip analog signal digitizer for BIST (built-in self-test) applications. Numerical simulations are performed to validate the techniques and accurate estimation of the parameters can be obtained at the presence of noise.

DOI: 10.1109/TEST.2000.894315

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