Testing Static and Dynamic Faults in Random Access Memories

  title={Testing Static and Dynamic Faults in Random Access Memories},
  author={Said Hamdioui and Zaid Al-Ars and Ad J. van de Goor},
The ever increasing trend to reduce DPM levels of memories requires tests with very high fault coverages. The very important class of dynamic fault, therefore cannot be ignored any more. It will be shown in this paper that conventional memory tests constructed to detect the static faulty behavior of a specific defect do not necessarily detect its dynamic faulty behavior; which has been shown to exist. The dynamic fault behavior can take place in the absence of the static fault behavior. The… CONTINUE READING
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