Testing SRAM-Based Content Addressable Memories

  title={Testing SRAM-Based Content Addressable Memories},
  author={Jun Zhao and V. Swamy Irrinki and Mukesh Puri and Fabrizio Lombardi},
  journal={IEEE Trans. Computers},
ÐThis paper presents an extensive model and algorithms for detecting faults in SRAM-based dual-port and uni-port CAMs (Content Addressable Memories). This model is based on analyzing the functionalities of a cell of an SRAM-based CAM and dividing it into two parts (storage and comparison parts). It is shown that faults can affect one or both parts. While storage faults can be detected using a traditional test algorithm (such as the March C), faults affecting the comparison part of the cell… CONTINUE READING
Highly Cited
This paper has 26 citations. REVIEW CITATIONS

From This Paper

Topics from this paper.


Publications citing this paper.
Showing 1-10 of 19 extracted citations


Publications referenced by this paper.
Showing 1-10 of 13 references

Brzozowski, aAn Approach to Modeling and Testing Memories and Its Application to CAMs,o

  • J.A.P.R. Sidorowicz
  • Proc. IEEE VTS,
  • 1998
2 Excerpts

aTLB/CAM Test Pattern Specification,o CAD, LSI

  • A. Balakrishnan, J. Qian
  • 1998
2 Excerpts

A Test for Unlinked Memory Faults,o

  • A. J. Van de Goor, G. N. Gaydadjiev, U aMarch
  • IEEE Proc. Circuits Devices Systems,
  • 1997
2 Excerpts

aUse of Selective Precharge for Low-Power on the Match Lines of Content-Addressable Memories,o

  • C. A. Zukowski, S.-Y. Wang
  • Proc. IEEE Int'l Workshop Memory,
  • 1997

Mikitjuk, aMarch LR: A Test for Realistic Linked Faults,o

  • A. J. Van de Goor, G. N. Gaydadjiev, V. N. Yarmolik, V.G
  • Proc IEEE VTS,
  • 1996
2 Excerpts

Jalowiecki, aYield and Cost Estimation for a CAM_Based Parallel Processor,o

  • I.P.W.B. Noghani
  • Proc. IEEE Int'l Workshop Memory,
  • 1995

aOn Fault Modeling and Testing of Content-Addressable Memories,o

  • W. K. Al-Assadi, A. P. Jayasumana, Y. K. Malaiya
  • Proc. IEEE Int'l Workshop Memory,
  • 1994
1 Excerpt

Similar Papers

Loading similar papers…