Testing SRAM-Based Content Addressable Memories

@article{Zhao2000TestingSC,
  title={Testing SRAM-Based Content Addressable Memories},
  author={Jun Zhao and V. Swamy Irrinki and Mukesh Puri and Fabrizio Lombardi},
  journal={IEEE Trans. Computers},
  year={2000},
  volume={49},
  pages={1054-1063}
}
ÐThis paper presents an extensive model and algorithms for detecting faults in SRAM-based dual-port and uni-port CAMs (Content Addressable Memories). This model is based on analyzing the functionalities of a cell of an SRAM-based CAM and dividing it into two parts (storage and comparison parts). It is shown that faults can affect one or both parts. While storage faults can be detected using a traditional test algorithm (such as the March C), faults affecting the comparison part of the cell… CONTINUE READING
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