Testing Comparison Faults of Ternary Content Addressable Memories with Asymmetric Cells

@article{Li2007TestingCF,
  title={Testing Comparison Faults of Ternary Content Addressable Memories with Asymmetric Cells},
  author={Jin-Fu Li},
  journal={16th Asian Test Symposium (ATS 2007)},
  year={2007},
  pages={501-506}
}
  • Jin-Fu Li
  • Published 2007 in 16th Asian Test Symposium (ATS 2007)
Ternary content addressable memory (TCAM) is one key component in the dedicated hardware modulars for high-performance networking applications. Symmetric and asymmetric cells are two widely used cell structures in TCAMs. An asymmetric cell consists of a binary content addressable memory (BCAM) bit and a mask bit. This paper proposes two march-like test… CONTINUE READING