Testability modeling usage in design-for-test and product lifecycle cost reduction

@article{Valfre2012TestabilityMU,
  title={Testability modeling usage in design-for-test and product lifecycle cost reduction},
  author={James Valfre},
  journal={2012 IEEE AUTOTESTCON Proceedings},
  year={2012},
  pages={39-41}
}
  • James Valfre
  • Published 2012 in 2012 IEEE AUTOTESTCON Proceedings
Weapon systems have become increasingly complex and customer funding has become constricted. Customers and contractors are in an environment where the cost of test systems has to be reduced yet still test effectively in order to remain competitive. In an effort to reduce the total development and lifecycle cost, companies are using Design-For-Test (DFT… CONTINUE READING