Test time of multiplier/accumulator based output response analyzer in built-in analog functional testing

@article{Qin2009TestTO,
  title={Test time of multiplier/accumulator based output response analyzer in built-in analog functional testing},
  author={Jie Qin and Charles E. Stroud and Foster F. Dai},
  journal={2009 41st Southeastern Symposium on System Theory},
  year={2009},
  pages={363-367}
}
A Built-In Self-Test (BIST) approach has been proposed for functionality measurements of analog circuitry in mixed-signal systems. The BIST circuitry consists of a direct digital synthesizer (DDS) based test pattern generator (TPG) and multiplier/accumulator (MAC) based output response analyzer (ORA). In this paper we investigate and discuss the test time required by the ORA for analog measurements such as frequency response and 3rd order intercept point (IP3). We show that the test time can be… CONTINUE READING