Test structure for universal estimation of MOSFET substrate effects at gigahertz frequencies

@inproceedings{Kolding2000TestSF,
  title={Test structure for universal estimation of MOSFET substrate effects at gigahertz frequencies},
  author={Troels Emil Kolding},
  year={2000}
}
This paper presents a unit test structure for investigation of bulk effects critical to scalable MOSFET models at gigahertz frequencies. The results are transformed into a generalized representation which may be used in conjunction with existing compact models. The gate-modified test structure is compatible with standard CMOS technology and reveals the dependence of diffusion bias on substrate effects. Several MOSFET layout guidelines are suggested for improved consistency between simulation… CONTINUE READING

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