Test slice difference technique for low power encoding

Abstract

In this paper, we present a low power strategy for test data compression that is called ldquobreak-independent-table (BIT) encodingrdquo. In addition, we present a new decompression scheme for test vectors that is called ldquotest slice difference techniquerdquo to solve huge test data volume that must be stored in the tester memory. About how reducing… (More)
DOI: 10.1109/HLDVT.2008.4695869

Topics

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Cite this paper

@article{Li2008TestSD, title={Test slice difference technique for low power encoding}, author={Wei-Lin Li and Tsung-Tang Chen and Po-Han Wu and Jiann-Chyi Rau}, journal={2008 IEEE International High Level Design Validation and Test Workshop}, year={2008}, pages={25-32} }