Test sequences to achieve high defect coverage for synchronous sequential circuits

@article{Pomeranz1998TestST,
  title={Test sequences to achieve high defect coverage for synchronous sequential circuits},
  author={Irith Pomeranz and Sudhakar M. Reddy},
  journal={IEEE Trans. on CAD of Integrated Circuits and Systems},
  year={1998},
  volume={17},
  pages={1017-1029}
}