Test response compression and bitmap encoding for embedded memories in manufacturing process monitoring

@inproceedings{Chen2001TestRC,
  title={Test response compression and bitmap encoding for embedded memories in manufacturing process monitoring},
  author={John T. Chen and Jitendra Khare and Ken Walker and Saghir A. Shaikh and Janusz Rajski and Wojciech Maly},
  booktitle={ITC},
  year={2001}
}
This paper introduces a method that enables the diagnosis of embedded memories via test response compression and automatic bitmap recognition. The proposed method has been tested via simulation with various memory specijications, fail patterns and test algorithms: it has also been implemented in a 0.18 pm CMOS test chip. 
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et . al . , “ DFT Advances in Motorola ’ s MPC 7400 , a PowerPC Microprocessor

  • C. Pyron
  • DFTfor Digital IC ’ s and Embedded Core Systems
  • 1999

Yield Diagnosis through Interpretation of Tester Data,

  • W. Maly
  • Pmc. Int’l Test Con$
  • 1987

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