Test of a fine pitch SOI pixel detector with laser beam

@inproceedings{Liu2015TestOA,
  title={Test of a fine pitch SOI pixel detector with laser beam},
  author={Yi Liu and Yunpeng Lu and Xudong Ju and Qun Ouyang},
  year={2015}
}
  • Yi Liu, Yunpeng Lu, +1 author Qun Ouyang
  • Published 2015
  • Physics
  • A silicon pixel detector with fine pitch size of 19×19 μm, developed base on SOI (silicon on insulator) technology, was tested under the illumination of infrared laser pulses. As an alternative way to particle beam tests, the laser pulses were tuned to very short duration and small transverse profile to simulate the tracks of MIPs (minimum ionization particles) in silicon. Hit cluster sizes were measured with focused laser pulses propagating through the SOI detector perpendicular to its surface… CONTINUE READING

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