Test mode method and strategy for RF-based fault injection analysis for on-chip relaxation oscillators under EMC standard tests or RFI susceptibility characterization

@article{Olmos2010TestMM,
  title={Test mode method and strategy for RF-based fault injection analysis for on-chip relaxation oscillators under EMC standard tests or RFI susceptibility characterization},
  author={Alfredo Olmos and Andre Vilas Boas and E. R. da Silva and Jorge Carvalho Silva and Ricardo Maltione},
  journal={2010 11th Latin American Test Workshop},
  year={2010},
  pages={1-3}
}
Nowadays some microcontroller clock circuits have been implemented using relaxation oscillators instead of quartz type approach to attend cost effective designs. The oscillator is compensated over temperature and power supply and trimming during device test phase adjusts the oscillation frequency on target to overcome process variations. In that way, the relaxation oscillator becomes competitive with regard to ceramic resonator options. However, robust applications as industrial, automotive and… CONTINUE READING
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