Test generation in VLSI circuits for crosstalk noise

@article{Chen1998TestGI,
  title={Test generation in VLSI circuits for crosstalk noise},
  author={Weiyu Chen and Sandeep Kumar Gupta and Melvin A. Breuer},
  journal={Proceedings International Test Conference 1998 (IEEE Cat. No.98CH36270)},
  year={1998},
  pages={641-650}
}
  • Weiyu ChenS. GuptaM. Breuer
  • Published 18 October 1998
  • Computer Science
  • Proceedings International Test Conference 1998 (IEEE Cat. No.98CH36270)
This paper addresses the problem of efficiently and accurately generating two-vector tests for crosstalk induced effects, such as pulses, signal speedup and slowdown, in digital combinational circuits. [] Key Method Our modeling technique captures such properties as the amplitude of a pulse and its rise/fall times and the delay through a device. To expedite the computation of the response of a logic gate to an input pulse, we have developed a novel way of modeling such gates by an equivalent inverter.
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