Test data compression for IP embedded cores using selective encoding of scan slices

@article{Wang2005TestDC,
  title={Test data compression for IP embedded cores using selective encoding of scan slices},
  author={Zhanglei Wang and Krishnendu Chakrabarty},
  journal={IEEE International Conference on Test, 2005.},
  year={2005},
  pages={10 pp.-590}
}
We present a selective encoding method that reduces test data volume and test application time for scan testing of intellectual property (IP) cores. This method encodes the slices of test data that are fed to the scan chains in every clock cycle. Unlike many prior methods, the proposed method does not encode all the specified (0s and 1s) and unspecified (don't-care) bits in a slice. For example, if a slice contains more 1s than 0s, only the 0s are encoded and all don't-cares are mapped to 1. We… CONTINUE READING
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