Test cost saving and challenges in the implementation of /spl times/6 and /spl times/8 parallel testing on freescale 16-bit HCS12 microcontroller product family

  • Lew Boon Kian
  • Published 2006 in
    Third IEEE International Workshop on Electronic…

Abstract

One of the pressing issues faced by the semiconductor industry today is the cost of testing, especially on the low cost and high volume microcontroller (MCU) supply to automotive market. This paper describes the general consideration and justification made on the investment of tester, handler and device interface board (DIB) to enable the /spl times/6 and… (More)

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