Test case purification for improving fault localization

  title={Test case purification for improving fault localization},
  author={J. Xuan and Monperrus Martin},
  journal={Proceedings of the 22nd ACM SIGSOFT International Symposium on Foundations of Software Engineering},
  • J. Xuan, Monperrus Martin
  • Published 2014
  • Computer Science, Engineering
  • Proceedings of the 22nd ACM SIGSOFT International Symposium on Foundations of Software Engineering
Finding and fixing bugs are time-consuming activities in software development. Spectrum-based fault localization aims to identify the faulty position in source code based on the execution trace of test cases. Failing test cases and their assertions form test oracles for the failing behavior of the system under analysis. In this paper, we propose a novel concept of spectrum driven test case purification for improving fault localization. The goal of test case purification is to separate existing… Expand
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