Test Versus Security: Past and Present

@article{DaRolt2014TestVS,
  title={Test Versus Security: Past and Present},
  author={Jean DaRolt and Amitabh Das and Giorgio Di Natale and Marie-Lise Flottes and Bruno Rouzeyre and Ingrid Verbauwhede},
  journal={IEEE Transactions on Emerging Topics in Computing},
  year={2014},
  volume={2},
  pages={50-62}
}
Cryptographic circuits need to be protected against side-channel attacks, which target their physical attributes while the cryptographic algorithm is in execution. There can be various side-channels, such as power, timing, electromagnetic radiation, fault response, and so on. One such important side-channel is the design-for-testability (DfT) infrastructure present for effective and timely testing of VLSI circuits. The attacker can extract secret information stored on the chip by scanning out… CONTINUE READING
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