Test Procedures for Proton-Induced Single Event Latchup in Space Environments

@article{Felix2007TestPF,
  title={Test Procedures for Proton-Induced Single Event Latchup in Space Environments},
  author={J. A. Felix and J. R. Schwank and M. R. Shaneyfelt and Jacques Baggio and Philippe Paillet and Veronique Ferlet-Cavrois and P. E. D. Dodd and Sylvain Girard and E. W. Blackmore},
  journal={IEEE Transactions on Nuclear Science},
  year={2007},
  volume={55},
  pages={2161-2165}
}
The effect of high energy proton irradiation and angle of incidence on single-event latchup (SEL) hardness is investigated as a function of temperature and power supply voltage to determine worst-case hardness assurance test conditions for space environments. SRAMs from several vendors were characterized for single-event latchup SEL hardness at proton energies from 20 to 500 MeV at temperatures of 25 degC and 80 degC, and at both normal and grazing angles of incidence. For all SRAMs… CONTINUE READING
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