Test Pattern Generation for Transition Faults with Low Power using BS-LFSR and LOC

Abstract

—Transition fault testing is widely practiced in industry due to reduce or manage the fault count in IC and reduce the switching transition to reduce the power consumption. By merging of the test cubes from the test generation the low power test patterns are achieved for transition faults. In this paper two techniques named as BS-LFSR and Launch-Off-Capture… (More)

7 Figures and Tables

Topics

  • Presentations referencing similar topics