Test Pattern Generation and Compaction for Crosstalk Induced Glitch Faults

Abstract

This work proposes a TPG method for producing maximal crosstalk glitch effect on victim net by considering the spatial, temporal and functional properties of the circuits. The generated test set is then compacted initially through pattern merging and then through fault-list chaining algorithm. Finally different approaches to this algorithm are implemented for comparison.

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Cite this paper

@inproceedings{Hasan2009TestPG, title={Test Pattern Generation and Compaction for Crosstalk Induced Glitch Faults}, author={Shehzad Hasan}, year={2009} }