Test Data Compression for System-on-a-Chip using Count Compatible Pattern Run-Length Coding

@article{Yuan2014TestDC,
  title={Test Data Compression for System-on-a-Chip using Count Compatible Pattern Run-Length Coding},
  author={Haiying Yuan and Jiaping Mei and Hongying Song and Kun Guo},
  journal={J. Electronic Testing},
  year={2014},
  volume={30},
  pages={237-242}
}