Test Data Compression and Test Time Reduction of Longest-Path-Per-Gate Tests based on Illinois Scan Architecture

@inproceedings{Sharma2003TestDC,
  title={Test Data Compression and Test Time Reduction of Longest-Path-Per-Gate Tests based on Illinois Scan Architecture},
  author={Manish Sharma and Janak H. Patel and Jeff Rearick},
  booktitle={VTS},
  year={2003}
}
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