Test Data Compression Using Selective Encoding of Scan Slices

@article{Wang2008TestDC,
  title={Test Data Compression Using Selective Encoding of Scan Slices},
  author={Zhanglei Wang and Krishnendu Chakrabarty},
  journal={IEEE Transactions on Very Large Scale Integration (VLSI) Systems},
  year={2008},
  volume={16},
  pages={1429-1440}
}
We present a selective encoding method that reduces test data volume and test application time for scan testing of intellectual property (IP) cores. This method encodes the slices of test data that are fed to the scan chains in every clock cycle. To drive N scan chains, we use only c tester channels, where c=lceillog2(N+1)rceil+2 . In the best case, we can achieve compression by a factor of N/c using only one tester clock cycle per slice. We derive a sufficient condition on the distribution of… CONTINUE READING
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