Test-Case Generation for Embedded Binary Code Using Abstract Interpretation

Abstract

This paper describes a framework for test-case generation for microcontroller binary programs using abstract interpretation techniques. The key idea of our approach is to derive program invariants a priori, and then use backward analysis to obtain test vectors that are executed on the target microcontroller. Due to the structure of binary code, the abstract… (More)
DOI: 10.4230/OASIcs.MEMICS.2010.101
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@inproceedings{Reinbacher2010TestCaseGF, title={Test-Case Generation for Embedded Binary Code Using Abstract Interpretation}, author={Thomas Reinbacher and J{\"o}rg Brauer and Martin Horauer and Andreas Steininger and Stefan Kowalewski}, booktitle={MEMICS}, year={2010} }