• Corpus ID: 14646337

Test Access Circuit for Education

@inproceedings{Novk2005TestAC,
  title={Test Access Circuit for Education},
  author={Ondrej Nov{\'a}k},
  year={2005}
}
In this paper we present our new educational chip. This chip is one of three chips which were designed for educational purposes within the framework of the IST project REASON. Nowadays the Boundary Scan (BS) has become to be a standard for diagnostic access to the circuits, for in-circuit programming and for several other tasks. The Boundary Scan access is sometimes combined with a scan chain of concatenated peripheral and internal flip-flops. An alternative parallel diagnostic access method is… 

Figures from this paper

TEST_ACCESS BLOCK SERIAL SCAN VS. RANDOM ACCESS SCAN
A part of EduChip with code-name Test Access Block (TA block) is presented in this paper. This chip was developed to demonstrate two diagnostic access methods of digital ICs. Nowadays the Boundary

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