• DOI:10.1117/12.2183128
Corpus ID: 118178651

Terahertz characterization of electronic components and comparison of terahertz imaging with x-ray imaging techniques

@inproceedings{Ahi2015TerahertzCO,
  title={Terahertz characterization of electronic components and comparison of terahertz imaging with x-ray imaging techniques},
  author={Kiarash Ahi and N. Asadizanjani and S. Shahbazmohamadi and M. Tehranipoor and M. Anwar},
  booktitle={Sensing Technologies + Applications},
  year={2015}
}

Kiarash Ahi, N. Asadizanjani, +2 authors M. Anwar

Published in

Sensing Technologies…

2015

Materials Science, Engineering

THz radiation is capable of penetrating most of nonmetallic materials and allows THz spectroscopy to be used to image the interior structures and constituent materials of wide variety of objects including Integrated circuits (ICs). The fact that many materials in THz spectral region have unique spectral fingerprints provides an authentication platform to distinguish between authentic and counterfeit electronic components. Counterfeit and authentic ICs are investigated using a high-speed… CONTINUE READING

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