Temperature dependence of latchup in CMOS circuits

@article{Dooley1984TemperatureDO,
  title={Temperature dependence of latchup in CMOS circuits},
  author={J C Dooley and R. E. Jaeger},
  journal={IEEE Electron Device Letters},
  year={1984},
  volume={5},
  pages={41-43}
}
Measurements of the temperature dependence of holding current in bulk CMOS devices indicate that a substantial improvement in latchup resistance may be achieved by liquid-nitrogen temperature operation of CMOS technology. 

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