Temperature dependence of latchup in CMOS circuits

  title={Temperature dependence of latchup in CMOS circuits},
  author={J C Dooley and R. E. Jaeger},
  journal={IEEE Electron Device Letters},
Measurements of the temperature dependence of holding current in bulk CMOS devices indicate that a substantial improvement in latchup resistance may be achieved by liquid-nitrogen temperature operation of CMOS technology. 

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