Temperature and carrier-density dependence of Auger and radiative recombination in nitride optoelectronic devices

Abstract

Nitride light-emitting diodes are a promising solution for efficient solid-state lighting, but their performance at high power is affected by the efficiency-droop problem. Previous experimental and theoretical work has identified Auger recombination, a three-particle nonradiative carrier recombination mechanism, as the likely cause of the droop. In this… (More)

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