Techniques for small-signal analysis of semiconductor devices

  title={Techniques for small-signal analysis of semiconductor devices},
  author={Steven E. Laux},
  journal={IEEE Transactions on Electron Devices},
  • S. Laux
  • Published 1 October 1985
  • Engineering
  • IEEE Transactions on Electron Devices
Techniques for ascertaining the small-signal behavior of semiconductor devices in the context of numerical device simulation are discussed. Three standard approaches to this problem will be compared: (i) transient excitation followed by Fourier decomposition, (ii) incremental charge partitioning, and (iii) sinusoidal steady-state analysis. Sinusoidal steady-state analysis is shown to be the superior approach by providing accurate, rigorously correct results with reasonable computational cost… 
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