Techniques for foundry identification

  title={Techniques for foundry identification},
  author={James Bradley Wendt and Farinaz Koushanfar and Miodrag Potkonjak},
  journal={2014 51st ACM/EDAC/IEEE Design Automation Conference (DAC)},
Foundry identification is essential for many tasks including intellectual property protection, trust, and preventing counterfeiting. In this paper, we introduce statistical techniques for foundry detection, specifically for identifying from which foundry a particular chip originates from. The key idea is to consider the distributions of channel lengths and threshold voltages after employing a variant of SAT that extracts these two metrics. We apply Kolmogorov-Smirnov and other statistical tests… 

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