Technically Induced Surface Wave Fields, Part II: Measured and Calculated Admittance Spectra

@inproceedings{Auersch2010TechnicallyIS,
  title={Technically Induced Surface Wave Fields, Part II: Measured and Calculated Admittance Spectra},
  author={Lutz Auersch},
  year={2010}
}
Abstract Transfer admittance spectra of technically induced surface wave fields are analyzed in theory and experiments. Theoretical admittance spectra of layered soils are obtained by integration in wavenumber domain and compared with experimental admittances due to hammer or vibrator excitation. The admittance spectra are strongly influenced by the layering and damping of the soil. Deep stiff-soil layers yield a low-frequency cutoff, whereas a strong damping yields a high-frequency cutoff. A… CONTINUE READING