Corpus ID: 96451764

TRANSMISSION OF VERY SLOW ELECTRONS AS A DIAGNOSTIC TOOL

@inproceedings{Frank2013TRANSMISSIONOV,
  title={TRANSMISSION OF VERY SLOW ELECTRONS AS A DIAGNOSTIC TOOL},
  author={Ludek Frank and Jana Nebes{\'a}řov{\'a} and Ilona M{\"u}llerov{\'a}},
  year={2013}
}
The penetration of electrons through solids is retarded by sequences of their interactions with the matter in which the electron changes its direction of motion and loses its energy. Inelastic collisions, the intensity of which reaches a maximum at around 50 electronvolts (eV) and drops steeply on both sides of this fuzzy threshold, are decisive for the penetration of electrons. Transmission microscopy (TEM or STEM) observes thin samples of tens to hundreds of nanometres in thickness by passing… Expand
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References

SHOWING 1-10 OF 12 REFERENCES
Low energy electron microscopy
Low energy electron microscopy (LEEM) is a surface imaging technique in which the surface is illuminated by an approximately parallel electron beam at near normal incidence. The image is formed with… Expand
Scanning transmission low-energy electron microscopy
TLDR
An extension to the transmission mode of the cathode-lens-equipped scanning electron microscope, enabling operation down to the lowest energies of electrons, is discussed, enhancing the apparent transmissivity of the sample to more than 100%. Expand
A method of imaging ultrathin foils with very low energy electrons.
We demonstrate the possibility to examine the free-standing foils of thicknesses in units of nm in the scanning low energy electron microscope, using both reflected and transmitted electrons. Very… Expand
Attenuation and escape depths of low-energy electron emission
Abstract Electron transport and emission is simulated by two Monte Carlo (MC) programs. The first version is based on elastic Mott cross sections and inelastic loss functions with full dispersion Δ E… Expand
Some approaches to low-voltage scanning electron microscopy
Abstract The advantages of the low-energy electrons for surface study and different approaches to the design of low-voltage scanning electron microscope are briefly summarized. The retarding… Expand
Very Low Energy Scanning Electron Microscopy of Free-Standing Ultrathin Films
Instrument and methodology is presented for very low energy scanning transmission electron microscopy. The detector system provides simultaneous acquisitions of total reflected and transmitted… Expand
Very Low Energy Scanning Electron Microscopy
Abstract An overview of recent developments in very low energy scanning electron microscopy is presented. Electron optical aspects are briefly summarized including the low energy beam formation in a… Expand
Low-voltage electron microscopy of polymer and organic molecular thin films.
TLDR
The capabilities of a novel low-voltage electron microscope (LVEM) for imaging polymer and organic molecular thin films, which includes thin films of the organic semiconductor pentacene, triblock copolymer films, single-molecule dendrimers, electrospun polymer fibers and gold nanoparticles are demonstrated. Expand
Very low energy electron microscopy of graphene flakes
TLDR
Graphene samples examined by Raman spectroscopy and very low energy scanning transmission electron microscopy for diagnostics at larger dimensions can also be measured at very low energies. Expand
How to Observe Small Biological Objects in Low Voltage Electron Microscope
Extended abstract of a paper presented at MC 2007, 33rd DGE Conference in Saarbrücken, Germany, September 2 – September 7, 2007
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