TID Tolerance of Popular CubeSat Components
@article{Kingsbury2013TIDTO, title={TID Tolerance of Popular CubeSat Components}, author={R. Kingsbury and F. Schmidt and Kerri L. Cahoy and D. Sklair and W Blackwell and I. Osarentin and R. Legge}, journal={2013 IEEE Radiation Effects Data Workshop (REDW)}, year={2013}, pages={1-4} }
In this paper we report total dose test results of COTS components commonly used on CubeSats. We investigate a variety of analog integrated circuits, popular microcontrollers (PIC24), SD memory cards and a TCXO.
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