TID Tolerance of Popular CubeSat Components

@article{Kingsbury2013TIDTO,
  title={TID Tolerance of Popular CubeSat Components},
  author={R. Kingsbury and F. Schmidt and Kerri L. Cahoy and D. Sklair and W Blackwell and I. Osarentin and R. Legge},
  journal={2013 IEEE Radiation Effects Data Workshop (REDW)},
  year={2013},
  pages={1-4}
}
In this paper we report total dose test results of COTS components commonly used on CubeSats. We investigate a variety of analog integrated circuits, popular microcontrollers (PIC24), SD memory cards and a TCXO. 

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