• DOI:10.1109/REDW.2013.6658220
Corpus ID: 15891375

TID Tolerance of Popular CubeSat Components

@article{Kingsbury2013TIDTO,
  title={TID Tolerance of Popular CubeSat Components},
  author={R. Kingsbury and F. Schmidt and K. Cahoy and D. Sklair and W. Blackwell and I. Osarentin and R. Legge},
  journal={2013 IEEE Radiation Effects Data Workshop (REDW)},
  year={2013},
  pages={1-4}
}

• R. Kingsbury, F. Schmidt, +4 authors R. Legge
• Published 2013
• Engineering
• 2013 IEEE Radiation Effects Data Workshop (REDW)

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In this paper we report total dose test results of COTS components commonly used on CubeSats. We investigate a variety of analog integrated circuits, popular microcontrollers (PIC24), SD memory cards and a TCXO.