Corpus ID: 51781064

TESTING OF ADCS BY FREQUENCY-DOMAIN ANALYSIS IN MULTI-TONE MODE

@inproceedings{Belega2004TESTINGOA,
  title={TESTING OF ADCS BY FREQUENCY-DOMAIN ANALYSIS IN MULTI-TONE MODE},
  author={D. Belega},
  year={2004}
}
  • D. Belega
  • Published 2004
  • Engineering
  • In this paper the testing of analog-to-digital converters (ADCs) by frequency-domain analysis in multi-tone mode is investigated. The theoretical expressions of some of the most important ADC dynamic parameters are derived. Also, the theoretical expression of the difference between the ADC effective number of bits (ENOB) obtained by testing in multi-tone mode and the ENOB obtained by testing in the single-tone mode is derived. From the theoretical expression of this difference some important… CONTINUE READING
    6 Citations

    Figures from this paper.

    DAC Testing Using Impulse Signals
    • 1
    • PDF
    Using of AM and FM signal for ADC testing
    • 2
    ADC and DAC Testing Using Impulse Signals
    • J. Vedral, P. Fexa
    • Engineering
    • 2011 IEEE 17th International Mixed-Signals, Sensors and Systems Test Workshop
    • 2011
    • 1
    • Highly Influenced
    Developing automated data acquisition system for ADC and DAC testing
    • P. Fexa, J. Vedral
    • Computer Science
    • Proceedings of the 6th IEEE International Conference on Intelligent Data Acquisition and Advanced Computing Systems
    • 2011
    • 1

    References

    SHOWING 1-9 OF 9 REFERENCES
    A/D converter performance analysis by a frequency domain approach
    • 65
    ADC testing with IEEE Std 1241-2000
    • T. Linnenbrink, S. Tilden, M. T. Miller
    • Engineering
    • IMTC 2001. Proceedings of the 18th IEEE Instrumentation and Measurement Technology Conference. Rediscovering Measurement in the Age of Informatics (Cat. No.01CH 37188)
    • 2001
    • 20
    Measuring harmonic distortion and noise floor of an A/D converter using spectral averaging
    • 58
    Interpolation techniques for real-time multifrequency waveform analysis
    • C. Offelli, D. Petri
    • 6th IEEE Conference Record., Instrumentation and Measurement Technology Conference
    • 1989
    • 80
    • Highly Influential
    Applications with theTMS320C5x Board (in Romanian)
    • Ed. “Politehnica” of Timişoara,
    • 2003
    Most ADC System Require Intermodulation Testing, Electronic Design
    • 1992
    Optimal Choice of the Windows for ADC Characterization by Spectral Analysis in Single-Tone and Dual-Tone Modes, submitted for publication
    • Revue Roumaine des Sciences Techniques. Serie Electrotehnique et Energetique,
    • 2003
    Optimal Choice of the Windows for ADC Characterization by Spectral Analysis in SingleTone and DualTone Modes , submitted for publication in Revue Roumaine des Sciences Techniques
    • 2003