Systematic errors for a Mueller matrix dual rotating compensator ellipsometer.

@article{Broch2008SystematicEF,
  title={Systematic errors for a Mueller matrix dual rotating compensator ellipsometer.},
  author={Laurent Broch and Aotmane En Naciri and Luc Johann},
  journal={Optics express},
  year={2008},
  volume={16 12},
  pages={
          8814-24
        }
}
The characterization of anisotropic materials and complex systems by ellipsometry has pushed the design of instruments to require the measurement of the full reflection Mueller matrix of the sample with a great precision. Therefore Mueller matrix ellipsometers have emerged over the past twenty years. The values of some coefficients of the matrix can be very small and errors due to noise or systematic errors can induce distored analysis. We present a detailed characterization of the systematic… CONTINUE READING

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