Systematic achievement of improved atomic-scale contrast via bimodal dynamic force microscopy.

Abstract

Judiciously matched experiments, calculations, and theory demonstrate that a higher sensitivity to short-range interactions and, consequently, improved resolution on the atomic scale can be achieved by bimodal noncontact dynamic force microscopy. The combination of sub-Angström tip oscillation at the second flexural resonance of a commercially available silicon cantilever with the commonly used large amplitude oscillation at the fundamental resonance frequency enables this performance improvement while avoiding potentially damaging jump-to-contact instabilities.

Cite this paper

@article{Kawai2009SystematicAO, title={Systematic achievement of improved atomic-scale contrast via bimodal dynamic force microscopy.}, author={Shigeki Kawai and Thilo Glatzel and Sascha Koch and Bartosz Such and Alexis Baratoff and Ernst Meyer}, journal={Physical review letters}, year={2009}, volume={103 22}, pages={220801} }