System-level reliability assessment of mixed-signal convergent microsystems

  title={System-level reliability assessment of mixed-signal convergent microsystems},
  author={R. Pucha and S. Hegde and Mansour Damani and Krishna Tunga and A. E. Perkins and Savisha A. P. Mahalingam and G. Ramakrishna and G. Lo and Kevin M Klein and Jahanzeb Ahmad and S. K. Sitaraman},
  journal={IEEE Transactions on Advanced Packaging},
The next-generation convergent microsystems, based on system-on-package (SOP) technology, require up-front system-level design-for-reliability approaches and appropriate reliability assessment methodologies to guarantee the reliability of digital, optical, and radio frequency (RF) functions, as well as their interfaces. Systems approach to reliability requires the development of: i) physics-based reliability models for various failure mechanisms associated with digital, optical, and RF… CONTINUE READING