System - Level Design for Test of Fully Di erential Analog

Abstract

{ Analog IC test occupies a signiicant fraction of the design cycle. Testing costs are increased by the twin requirements of high precision and accuracy in signal measurement. We discuss a system level ACOB technique for fully diierential analog ICs. Our test techniques incorporate analog speciic constraints such as device matching, and circuit and… (More)

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Cite this paper

@inproceedings{Vinnakota2007SystemL, title={System - Level Design for Test of Fully Di erential Analog}, author={Bapiraju Vinnakota and Ramesh Harjani and Nicholas J. Stessman}, year={2007} }