Syndrome-Testable Design of Combinational Circuits

@article{Savir1980SyndromeTestableDO,
  title={Syndrome-Testable Design of Combinational Circuits},
  author={Jacob Savir},
  journal={IEEE Transactions on Computers},
  year={1980},
  volume={C-29},
  pages={442-451}
}
Classical testing of combinational circuits requires a list of the fault-free response of the circuit to the test set. For most practical circuits implemented today the large storage requirement for such a list makes such a test procedure very expensive. Moreover, the computational cost to generate the test set increases exponentially with the circuit size. 

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Syndrome-testable design of combinational circuit

  • J. Savir
  • Proc. 9th Ann. Int. Symp. on Fault-Tolerant…
  • 1979

Referenceless random testing

  • J. Losq
  • Proc. 6th Ann. Symp. on Fault-Tolerant Comput…
  • 1976
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