Syndrome-Testable Design of Combinational Circuits

  title={Syndrome-Testable Design of Combinational Circuits},
  author={Jacob Savir},
  journal={IEEE Transactions on Computers},
Classical testing of combinational circuits requires a list of the fault-free response of the circuit to the test set. For most practical circuits implemented today the large storage requirement for such a list makes such a test procedure very expensive. Moreover, the computational cost to generate the test set increases exponentially with the circuit size. 


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