Synchronous characterization of semiconductor microcavity laser beam.

  title={Synchronous characterization of semiconductor microcavity laser beam.},
  author={T. Wang and Gian Luca Lippi},
  journal={The Review of scientific instruments},
  volume={86 6},
  • T. WangG. Lippi
  • Published 5 June 2015
  • Physics
  • The Review of scientific instruments
We report on a high-resolution double-channel imaging method used to synchronously map the intensity- and optical-frequency-distribution of a laser beam in the plane orthogonal to the propagation direction. The synchronous measurement allows us to show that the laser frequency is an inhomogeneous distribution below threshold, but that it becomes homogeneous across the fundamental Gaussian mode above threshold. The beam's tails deviations from the Gaussian shape, however, are accompanied by… 

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  • A. Siegman
  • Physics
    Photonics West - Lasers and Applications in Science and Engineering
  • 1993
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