Switching Transient Generation in Surface Interrogation Scanning Electrochemical Microscopy and Time-of-Flight Techniques.

@article{Ahn2015SwitchingTG,
  title={Switching Transient Generation in Surface Interrogation Scanning Electrochemical Microscopy and Time-of-Flight Techniques.},
  author={Hyun Suk Ahn and Allen J Bard},
  journal={Analytical chemistry},
  year={2015},
  volume={87 24},
  pages={12276-80}
}
In surface interrogation scanning electrochemical microscopy (SI-SECM), fine and accurate control of the delay time between substrate generation and tip interrogation (tdelay) is crucial because tdelay defines the decay time of the reactive intermediate. In previous applications of the SI-SECM, the resolution in the control of tdelay has been limited to several hundreds of milliseconds due to the slow switching of the bipotentiostat. In this work, we have improved the time resolution of tdelay… CONTINUE READING

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Scanning Electrochemical Microscopy

A. J. Bard, M. V. Mirkin
J. J. Phys. Chem. C • 2012

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