Surpassing the lateral resolution limit by a factor of two using structured illumination microscopy

@article{Gustafsson2000SurpassingTL,
  title={Surpassing the lateral resolution limit by a factor of two using structured illumination microscopy},
  author={M. Gustafsson},
  journal={Journal of Microscopy},
  year={2000},
  volume={198}
}
  • M. Gustafsson
  • Published 2000
  • Materials Science, Medicine
  • Journal of Microscopy
Lateral resolution that exceeds the classical diffraction limit by a factor of two is achieved by using spatially structured illumination in a wide‐field fluorescence microscope. The sample is illuminated with a series of excitation light patterns, which cause normally inaccessible high‐resolution information to be encoded into the observed image. The recorded images are linearly processed to extract the new information and produce a reconstruction with twice the normal resolution. Unlike… Expand
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