Surge Step Stress Testing ( SSST ) of Tantalum Capacitors

@inproceedings{MarshallSurgeSS,
  title={Surge Step Stress Testing ( SSST ) of Tantalum Capacitors},
  author={Jim Marshall}
}
A misunderstanding of the failure mechanism of tan-talum capacitors has created the fear of using these ca-pacitors in high current applications. A capacitor depends on the dielectric as an insulative material and the plates as a conductive material. If the current was the trigger mechanism for failure, then the plates should be suspect throughout the life of the capacitor. This is not the case as the failures with this capacitor are normally related to initial power-on occurrences. As such… CONTINUE READING
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