Surface stress induced deflections of cantilever plates with applications to the atomic force microscope: Rectangular plates

@article{Sader2001SurfaceSI,
  title={Surface stress induced deflections of cantilever plates with applications to the atomic force microscope: Rectangular plates},
  author={John Elie Sader},
  journal={Journal of Applied Physics},
  year={2001},
  volume={89},
  pages={2911-2921}
}
  • J. Sader
  • Published 23 February 2001
  • Engineering
  • Journal of Applied Physics
Surface stress is a material property that underpins many physical processes, such as the formation of self-assembled monolayers and the deposition of metal coatings. Due to its extreme sensitivity, atomic force microscopy (AFM) has recently emerged as an important tool in the measurement of surface stress. Fundamental to this application is theoretical knowledge of the effects of surface stress on the deflections of AFM cantilever plates. In this article, a detailed theoretical study of the… 

Deflection of a cantilever rectangular plate induced by surface stress with applications to surface stress measurement

Surface stress plays important roles in the fabrication and applications of thin-film substrate systems. Bending test of cantilever microbeams has been commonly applied to characterize the surface

Effect of surface stress on the stiffness of thin elastic plates and beams

Nanomechanical doubly-clamped beams and cantilever plates are often used to sense a host of environmental effects, including biomolecular interations, mass measurements, and responses to chemical

Quantitative surface stress measurements using a microcantilever

A method for calculating the surface stress associated with the deflection of a micromechanical cantilever is presented. This method overcomes some of the limitations associated with Stoney’s formula

Static and Dynamic Structural Modeling Analysis of Atomic Force Microscope

As a cantilever structure, atomic force microscope (AFM) can be either modeled as a beam, plate or a simple one degree-of-freedom (DOF) system depending on its geometry and application scenario. The

Measurement of Mechanical Properties of Cantilever Shaped Materials

The effects of various force fields such as those induced by mass loading, residual stress, internal friction of the material, and other changes in the mechanical properties of the microcantilevers are discussed to present useful measurements of the associated elastic properties.

Surface stress-induced change in overall elastic behavior and self-bending of ultrathin cantilever plates

In this letter, the dominant role of surface stress and surface elasticity on the overall elastic behavior of ultrathin cantilever plates is studied. A general framework based on two-dimensional

Buckling of a cantilever plate uniformly loaded in its plane with applications to surface stress and thermal loads

Buckling of elastic structures can occur for loads well within the proportionality limit of their constituent materials. Given the ubiquity of beams and plates in engineering design and application,

Frequency response of curved bilayer microcantilevers with applications to surface stress measurement

Bilayer microcantilevers are normally curved because of fabrication-induced stresses. When used in biological/chemical sensing applications, the absorption of target agents onto the functionalized
...

References

SHOWING 1-10 OF 24 REFERENCES

Measuring the surface stresses in an electrochemically deposited metal monolayer : Pb on Au(111)

An atomic force microscope cantilever has been used as a bending-beam sensor to measure surface stress changes which occur during electrochemical processes. The mechanical properties of the lever and

A Sensitive Method to Measure Changes in the Surface Stress of Solids

Abstract A technique for determining surface stress changes at solid–gas and solid–liquid interfaces with an atomic force microscope is presented. Therefore, the bending of a microfabricated

Measurement and Interpretation of stress in aluminum-based metallization as a function of thermal history

Mechanical stress in interconnections is a problem of growing importance in VLSI devices. The origins of this stress are discussed, and a measurement technique based on the determination of wafer

Surface stress in the self-assembly of alkanethiols on gold

Surface stress changes and kinetics were measured in situ during the self-assembly of alkanethiols on gold by means of a micromechanical sensor. Self-assembly caused compressive surface stress that

THEORY OF PLATES AND SHELLS

CONTENTS: BENDING OF LONG RECTANGULAR PLATES TO A CYLINDRICAL SURFACE PURE BENDING OF PLATES SYMMETRICAL BENDING OF CIRCULAR PLATES SMALL DEFLECTIONS OF LATERALLY LOADED PLATES SIMPLY SUPPORTED

Physical chemistry of surfaces

Capillarity. The Nature and Thermodynamics of Liquid Interfaces. Surface Films on Liquid Substrates. Electrical Aspects of Surface Chemistry. Long--Range Forces. Surfaces of Solids. Surfaces of