Superresolution four-wave mixing microscopy.

Abstract

We report on the development of a superresolution four-wave mixing microscope with spatial resolution approaching 130 nm which represents better than twice the diffraction limit at 800 nm while retaining the ability to acquire materials- and chemical- specific contrast. The resolution enhancement is achieved by narrowing the microscope's excitation volume in the focal plane through the combined use of a Toraldo-style pupil phase filter with the multiplicative nature of four-wave mixing.

DOI: 10.1364/OE.20.006042

Cite this paper

@article{Kim2012SuperresolutionFM, title={Superresolution four-wave mixing microscopy.}, author={Hyunmin Kim and Garnett W. Bryant and Stephan J. Stranick}, journal={Optics express}, year={2012}, volume={20 6}, pages={6042-51} }