Superfast phase-shifting method for 3-D shape measurement.


Recently introduced DLP Discovery technology allows for tens of kHz binary image switching, which has great potential for superfast 3-D shape measurement. This paper presents a system that realizes 3-D shape measurement by using a DLP Discovery technology to switch binary structured patterns at very high frame rates. The sinusoidal fringe patterns are… (More)
DOI: 10.1364/OE.18.009684


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