Sulfonation of poly(N-vinylcarbazole) studied by combined time-of-flight secondary ion mass spectrometry and X-ray photoelectron spectroscopy

Abstract

A series of sulfonated poly(N-vinylcarbazole) (PVK) samples have been systematically studied by time-of-flight secondary ion mass spectrometry (TOF-SIMS) and X-ray photoelectron spectroscopy (XPS). Negative TOF-SIMS results provided unambiguous evidence that sulfonate groups are chemically attached to the carbazole moiety of PVK. The positive SIMS spectrum… (More)

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