Substrate Testing on a Multi-Site/Multi-Probe ATE

  title={Substrate Testing on a Multi-Site/Multi-Probe ATE},
  author={Xiaojun Ma and Fabrizio Lombardi},
  journal={J. Electronic Testing},
This paper presents a novel method that utilizes multi-site and multi-probe capabilities of an ATE for testing of pre-assembly MCM substrates. Testing multiple SUTs (substrates under test) simultaneously can improve the efficiency of the probes in an ATE and considerably reduce the total test time. An analytical model that predicts very accurately the testing time of a SUT batch is proposed. Based on this model, the optimal multi-site testing configuration as corresponding to the batch size can… CONTINUE READING

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